Program

Wednesday, May 16, 2018 Slides
12:30-14:00 Lunch
14:00-15:00 Joint ASYNC/FAC Keynote Presentation (Session Chair: Andrey Mokhov )
 
Alex Yakovlev  
Async-Analog: Happy Cross-talking?
15:00-15:30 Coffee break
15:30-17:30 Session 1 (Session Chair: Thomas Ferrère)
Maximilian Neuner, Michael Zwerger and Helmut Graeb: Analog Power-Down-Synthesis: Integration into an IC-Design Flow  
Justin Reiher and Mark Greenstreet: Combining the MVS Compact MOSFET model with Automatic Differentiation for flexible circuit analysis  
Delong Shang, Fei Xia, Xuefu Zhang and Alex Yakovlev: Model-based design of asynchronous controllers for flexible on-chip power buffers abstract
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Michael Rathmair, Carna Radojicic and Christoph Grimm: In-field Simulation Considering Analog Variability abstract
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19:30- Dinner

 

Thursday, May 17, 2018 Slides
09:00-10:00 FAC Keynote Presentation (Session Chair: Dejan Nickovic)
Dieter Härle
Trends and Challenges in Analog and Mixed-Signal-Verification slides
10:00-10:30 Coffee break
10:30-12:30 Session 2 (Session Chair: Alexey Bakhirkin)
Ramin M. Hasani, Benjamin Kulnik, Dieter Haerle and Radu Grosu: Artificial Intelligence Solutions for Verification of Analog and Mixed-Signal Smart Power Systems abstract
Ahmad Tarraf and Lars Hedrich: Automatic Abstraction of Transistor Level Circuits to Hybrid Automata abstract

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Christoph Grimm and Carna Radojicic: Abstraction of real-valued quantities: A coin with more than two sides
Vladimir Dubikhin, Chris Myers and Alex Yakovlev: Model Discovery for Analog/Mixed-Signal Circuits abstract

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12:30-14:00 Lunch
14:00-15:30 Session 3 (Session Chair: Lars Hedrich)
Alexey Bakhirkin, Thomas Ferrère and Oded Maler: Towards Fast Parametric Identification for STL abstract

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Laura Nenzi, Simone Silvetti, Ezio Bartocci, Luca Bortolussi: A genetic algorithm for learning temporal logic classifiers
David Schreiber and Jürgen Kampe: Complete Performance Space Modeling for Analog IC abstract

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15:30-16:00 Coffee break
16:00-17:30 Session 4 (Session Chair: Christoph Grimm)
Jaeha Kim: New Opportunities for Analog Formal Verification with Piecewise-Linear Device Modeling
Nektar Xama, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette and Georges Gielen: Speeding up Repeated Analog Simulations for Reliability and Testing abstract

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Niveditha Manjunath, Mario Heindl, Dieter Haerle, Stephen Sabanal, Herbert Eichinger, Hermann Tauber, Andreas Machne, Christian Manthey, Mikko Väänänen, Radu Grosu and Dejan Nickovic: Production Test Coverage Analysis for Mixed-Signal circuits
End of workshop